Technology and Application of Nondestructive Residual Stress Measurement by Neutron Diffraction

The technology and application of residual stress analysis by neutron diffraction

中子衍射残余应力分析技术及其应用

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A-fe2o3 ( haematite) was one of the first compounds to be studied by neutron diffraction.

a-fe2o3（赤铁矿）是中子衍射最先研究的化合物之一。

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In order to eliminate the false singularities in the Fringe Components of Equivalent Edge Currents expressions, this paper extends the treatment of false singularities of diffraction coefficients in the Physical Theory of Diffraction into the Fringe Components of Equivalent Edge Currents expressions.

为消除等效电磁流边缘分量表达式中虚假奇异点，将物理绕射理论中处理绕射系数的虚假奇异点的方法推广到等效电磁流边缘分量表达式中。

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In optical measurement, we could calibrate precision instrument and increase the measuring precision by using the laser interference ( diffraction) fringe orders; the fringe orders could be automatically determined by the zero order fringes' minimum chromatic polarization;

光测量主要通过激光发生干涉（衍射），利用干涉（衍射）条纹的级次进行定标、精确测量，利用零级条纹色偏最小原理，对条纹级次进行自动判断；

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The distance between adjacent dark fringes of diffraction fringe of wire is determined at low and high temperature by CCD detector, the value of high temperature is measured by pyrophotometer, and the coefficient of linear expansion of wire is calculated.

利用CCD探测器分别测出常温和高温下金属丝衍射花样相邻暗纹的间距，用光学高温计测出加热时的温度值，从而求出线膨胀系数。

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Analytic Expression of Diffraction Fringe of Varied-line-space Plane Gratings

平面变线距光栅衍射场的解析表达式

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Variation in single slit Fraunhofer ′ s diffraction fringe in transparent medium

透明介质中单缝Fraunhofer′s衍射条纹的变化

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When the slit of light source there is definite width W, the width of diffraction fringe should increase, and the minimum resolving angle Δθ k should be increasing, then the resolving power of actual grating system should be decreasing.

当光源狭缝还有一定宽度W时，衍射条纹将增宽，相应最小分辨角Δθk将增大，实际光栅系统的分辨本领将减小。

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The measurement of diffraction fringe width, the tropism of incident light E and the transverse displacement of CCD are the main factors that influence this precision from the study of theoretical arithmetic and experiment.

理论计算和实验表明影响细丝直径测量精度的因素包括：衍射条纹宽度的测量、入射光波E取向和CCD的横向移动等。

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Traditional optical disc recording technology has limited storage density and low information transfer rate due to laser diffraction spot size limitation ( micron order of magnitude). A new type of 3-D storage technology is proposed in thesis.

本文基于传统的光盘记录技术因受激光衍射光斑极限的限制（微米数量级），存储密度有限，且其信息传输速率较低，故提出一种新型的三维存储技术。

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Primary parameters and living examples are given to show how to determine the parameter of optical system and make diffraction spot radius match detector size in laser heterodyne detecting system with both receiver and transmitter.

着重介绍了在收发合置式激光外差探测系统中，如何确定光学系统的参数，使成像的衍射斑与探测器尺寸匹配，并符合天线定理给出的条件，满足探测器混频的要求。

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An Imaging Processing Method for Measuring the Array Position of Diffraction Spot of High Power Laser Beam

测量高功率激光束衍射光斑阵列位置的图象处理方法

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Analysis of Electron Diffraction Spot Patterns by Using Microcomputer

电子衍射花样的微型机分析

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This paper describes two microcomputer programs of electron diffraction spot patterns.

本文介绍了两种电子衍射花样的微型机分析程序。

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We analyse the correlation image, present the way that removes liquid crystal diffraction spot, direct current spot and image noise, and binarize the correlation image finally.

提出了消除液晶衍射光斑、直流光斑和图像噪声的方法；最后对相关峰图像进行了二值化处理。

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Then the diffraction spot size is decreased, and the optical resolution is increased, so the accuracy of the fine tracking system is improved.

由此减小接收衍射光斑的大小，提高系统的光学分辨能力，从而提高精跟踪系统的精确性。

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The broadening of diffraction line is called broadening effect.

这种使衍射峰变宽的现象被称为超微粒子的（？）

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Pt-particle size was determined by three methods: Xray Diffraction Line Broadening, Transmission Electron Microscope and Hydrogen Chemisorption. The dispersion of Pt in NaY zeolite and the effect of Pt particle size on hydrogen spill-over were also discussed.

用X&射线衍射峰宽化法、透射电子显微镜和氢化学吸附三种方法测定了Pt粒大小，讨论了Pt在NaY中的分散性及三种测定分散度方法的特点。

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Based on GTD, this paper presents accurate tracing equations for the diffraction ray on the cone and cylinder which are suitable for both the far field and the near field and more accurate than those in the literature published in recent years.

基于几何绕射理论研究了圆锥体以及圆柱体上精确的绕射线寻迹方程，所得公式在射线寻迹上适用于远场与近场，比目前文献提及的方法更精确。

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Simulation for Etching Diffraction Grating by Use of Scalar Diffraction Theory

标量衍射理论模拟蚀刻衍射光栅

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