1、

AFM be provided with higher resolution than the scanning electron microscopy.

与扫描电子显微镜相比,它具有较高的分辨率.

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2、

An AFM model has been developed by Chongqing University. The principles of operation and some applications were reported briefly. The special design of the lens body was introduced in detail.

简述了重庆大学研制的原子力显微镜(AFM)样机的工作原理和应用,重点介绍了其镜体的独特设计。

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3、

Methods : T he cultured U 251 glioma cell line was detected with atomic force microscope AFM.

方法应用原子力显微镜,对U251胶质瘤细胞系进行观测.

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4、

The effects of antibacterial agent hygromycin and Carboxin on morphology of Ustilago maydis were investigated by AFM.

通过AFM研究抑菌剂萎锈灵和潮霉素对玉米黑粉菌细胞形貌的影响。

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5、

SEM analysis demonstrated that surface morphology of the coatings was changed compared with that of basal surface, and were also covered with different granules in nano size. The results of AFM examination also proved almost the same tendancy.

扫描电镜观察发现与纯钛基底面相比,涂层的表面形貌发生了改变,也是布满了各种不同大小的纳米级别的颗粒;AFM检测结果也证实了相同的变化趋势。

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6、

The AFM head is mounted without Abbe error in the X and Y directions.

原子力测头的布置在X、Y方向无阿贝误差.

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7、

Objective: To image the structure of the lipid bilayer at the nanometer level with AFM.

目的: 通过原子力显微镜从纳米水平成像人工磷脂双分子层的结构细节.

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8、

Deposit-dip-spin ( DDS ) coating method, a composite nano-powder sample preparation method for atomic force microscope ( AFM ) measurement is introduced.

介绍了一种改进旋涂法 —— DDS 涂膜法 ( Deposit-Dip-Spin-coating), 主要用来制备纳米粉体原子力显微镜 ( AFM ) 分析样品.

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9、

Clear AFM images were ( obtained ) from PbZr _ ( 0.90 ) Ti _ ( 0.10 ) O _ 3-Fe _ ( 0.003 ) nano powder sample prepared by DDS method.

采用DDS法制备PbZr0.90Ti0.10O3-Fe0.003 ( PZT -Fe ) 纳米粉体样品,得到了清晰的AFM图像.

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10、

Cr participated in hydrating reaction and formed new compounds , which was similar with Afm in structure.

铬元素参与水泥水化反应生成类似于单硫型水化硫铝酸盐结构的含铬结晶相.

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11、

Conclusion AFM is an excellent instrument for observe the subcellular ultrastructure.

结论原子力显微镜是研究亚细胞超微结构的有力武器.

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12、

Analyzing surface appearance and interface with scanning tunneling microscope ( STM ) and atom forces microscope ( AFM ).

使用扫描隧道显微镜 ( STM ) 、原子力显微镜 ( AFM ) 观察了薄膜的表面形貌.

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